detalle del documento
IDENTIFICACIÓN

oai:HAL:hal-04222033v1

Tema
[MATH]Mathematics [math] [INFO]Computer Science [cs]
Autor
Helmer, Martin Tsigaridas, Elias
Langue
en
Editor

HAL CCSD;Elsevier

Categoría

tecnologías: informática

Año

2024

fecha de cotización

7/12/2023

Palabras clave
exponential
Métrico

Resumen

International audience; We present a probabilistic algorithm to test if a homogeneous polynomial ideal I defining a scheme X in ℙn is radical using Segre classes and other geometric notions from intersection theory.

Its worst case complexity depends on the geometry of X.

If the scheme X has reduced isolated primary components and no embedded components supported the singular locus of Xred=V(I√), then the worst case complexity is doubly exponential in n; in all the other cases the complexity is singly exponential.

The realm of the ideals for which our radical testing procedure requires only single exponential time includes examples which are often considered pathological, such as the ones drawn from the famous Mayr-Meyer set of ideals which exhibit doubly exponential complexity for the ideal membership problem.

Helmer, Martin,Tsigaridas, Elias, 2024, Segre-driven radicality testing, HAL CCSD;Elsevier

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